A single-photon CMOS image sensor (CIS) design based on pinned photodiode (PPD)\nwith multiple charge transfers and sampling is described. In the proposed pixel architecture, the\nphotogenerated signal is sampled non-destructively multiple times and the results are averaged.\nEach signal measurement is statistically independent and by averaging, the electronic readout noise\nis reduced to a level where single photons can be distinguished reliably............................
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